X6.03-9186 (SBIR 2005-1)
Rapid Detection of Gas Hazards and Leaks with an Atmospheric Sampling, High Resolution, Mass Spectrometer with Low Pumping Requirements
|
Ionwerks
Ketti Eipers-Smith,
kes@ionwerks.com
|
$69,774.19 |
TX |
ESMD |
KSC |
2005 |
H3.03-9517 (SBIR 2002-1)
Hybrid Data System and Ion Detector for TOF Mass Spectrometry
|
Ionwerks
Maria Ambriz,
Dempsey@ionwerks.com
|
$69,983.99 |
TX |
N/A |
KSC |
2002 |
A6.02-9407 (SBIR 2002-1)
Characterization and synthesis of carbon nano-materials by LDI-IM TOF MS
|
Ionwerks
Maria Ambriz,
Dempsey@ionwerks.com
|
$69,856.99 |
TX |
N/A |
JPL |
2002 |
09.02-9880 (SBIR 1999-1)
Filamentless Molecular Beam Ionizer for Time-of-Flight Mass Spectrometry
|
Ionwerks
J. Schultz,
ionwerks@aol.com
|
$70,000.00 |
TX |
N/A |
KSC |
1999 |
09.02-9880 (SBIR 1999-2)
Filamentless Molecular Beam Ionizer for Time-of-Flight Mass Spectrometry
|
Ionwerks
J. Schultz,
ionwerks@aol.com
|
$600,000.00 |
TX |
N/A |
KSC |
1999 |
17.04-9880 (SBIR 1996-1)
A Flight Rated Time Of Flight Mass Spectrometer With 10(-15) Torr Sensitivity For Insitu Thin Film Process Control
|
Ionwerks
J. Albert Schultz,
|
$70,000.00 |
TX |
N/A |
MSFC |
1996 |
17.04-9880 (SBIR 1996-2)
A FLIGHT RATED TIME OF FLIGHT MASS SPECTROMETER WITH 10(-15) TORR SENSITIVITY FOR INSITU THIN FILM PROCESS CONTROL
|
Ionwerks
J. Albert Schultz,
|
$588,236.00 |
TX |
N/A |
MSFC |
1996 |
15.04-9880A (SBIR 1995-1)
HIGH FLUX ATOMIC OXYGEN SOURCE ALLOWING RAPID OXIDE THIN FILM GROWTH IN LOW EARTH ORBIT
|
Ionwerks
J. ALBERT SCHULTZ,
|
$68,011.00 |
TX |
N/A |
HQ |
1995 |
15.04-9880A (SBIR 1995-2)
HIGH FLUX ATOMIC OXYGEN SOURCE ALLOWING RAPID OXIDE THIN FILM GROWTH IN LOW EARTH ORBIT
|
Ionwerks
J. ALBERT SCHULTZ,
|
$598,675.00 |
TX |
N/A |
MSFC |
1995 |
04.10-1691 (SBIR 1988-1)
Atomic Oxygen Source for Superconductor Thin-Film Fabrication
|
Ionwerks
J. Albert Schultz,
|
$49,000.00 |
TX |
N/A |
JPL |
1988 |