Project Title:

MCP BASED PHOTON COUNTING ON CHIP CAMERA

94-1	08.07	1167		

MCP BASED PHOTON COUNTING ON CHIP CAMERA

Abstract:

Microchannel Plates are widely used for astrophysical imaging of 
UV, XUV and X-Ray photons. While MCP detectors are intrinsically 
capable of high resolution and fast response in large areas, they 
are limited by the available readout techniques.  
Recently, a large area UV camera consisting of a MCP detector 
coupled with a multilayer serpentine delay line (SDL) anode readout 
has been fabricated and operated with excellent spatial resolution, 
wide dynamic range and good spatial linearity. While this readout 
scheme is very promising, there are some technical problems 
associated with the construction of multilayer SDL devices. The 
printed circuit (PC) board technology currently used in SDL 
fabrication is not very precise and is costly due to expensive 
machining like laser ablation that is needed for fabricating 
multilayer SDL structures. 
In view of this, we propose to fabricate the SDL multilayer anodes 
on silicon wafers using integrated circuit fabrication technology. 
Silicon processing is extremely well developed and complex 
multilayer structures with more than 20 layers, strict tolerances 
and sub-micron dimensions are routinely produced. Hence we believe 
that multilayer SDL anodes can be fabricated easily and 
economically on silicon, and thereby provide a large area, high 
resolution readout system for MCP detectors. 

Large area, high resolution MCP detection systems would be widely 
used in various UV and soft X-ray astrophysical observations. In 
additions, such instruments would also be well suited for other 
applications such as X-ray diffraction, UV monitoring for 
industrial process control, UV photolithography, dosimetry and 
charged particle physics. 

Key Words

Radiation Monitoring Devices, inc.
44 Hunt Street
Watertown, MA 02172