Firm:

          

OptiPro Systems, LLC

          

   

Address:

          

6368 Dean Parkway, Ontario, NY 14519

          

   

Phone:

          

(585) 265-0160                                                                                                                                                                                

          

   

Name:

          

Dr. Robert Niederriter PhD

          

   

E-mail:

          

rniederriter@optipro.com

          

   

Address:

          

6368 Dean Parkway, NY 14519 - 8970

          

   

Phone:

          

(585) 265-0160                                                                                                                                                                                

          

   

Name:

          

Matthew Carlson

          

   

E-mail:

          

mcarlson@optipro.com

          

   

Address:

          

6368 Dean Parkway, NY 14519 - 8970

          

   

Phone:

          

(585) 265-0160                                                                                                                                                                                

          

   

Estimated Technology Readiness Level (TRL) :                                                                                                                                                          
Begin: 2
End: 3

          

          

     

Technical Abstract (Limit 2000 characters, approximately 200 words):

From flagship observatories to small earth-observation satellites, many NASA missions require high performance optical components that are also cost-effective to manufacture and launch. Freeform optical components can reduce a telescope's size and weight (reducing launch costs), but are challenging to test and validate with traditional metrology tools due to their lack of symmetry and large changes in curvature (increasing manufacturing costs). Improved metrology systems for freeform optics have potential to improve performance and reduce manufacturing costs by avoiding prescription-specific null correctors or holograms. Metrology systems for freeform optics require a challenging combination of capabilities: high-resolution (ideally sub-nanometer) measurement of large deviations from a planar surface and steep surface slope. At OptiPro Systems, we have recently developed (in part through NASA SBIR projects) a chromatic interferometric probe capable of sub-nanometer metrology of optical surfaces, which is essential for precision optical components such as telescope mirrors. The probe's range is currently limited to small surface sag ("measurement range") and shallow surface slope ("acceptance angle"), preventing direct application to freeform optics.

 

We propose fundamental enhancements to the chromatic interferometric probe to enable cost-effective metrology of freeform optics: wide measurement range and acceptance angle, while maintaining sub-nanometer performance. Such improvements require understanding unproven concepts and potentially major redesign of the probe optical system. The Phase I project aims to verify these concepts, using bread-board level proof-of-concept demonstration and computer simulations, and deliver a report detailing a clear path toward implementing these improvements in prototype probes and their use in metrology of high-performance freeform optics.

          

          

     

Potential NASA Applications (Limit 1500 characters, approximately 150 words):

Potential NASA applications include metrology of freeform and other optical components for NASA missions, including flagship/decadal missions, small satellites, and everything between. Some specific applications:

• Origins Space Telescope (OST) and Large UV/Optical/IR Surveyor (LUVOIR), which may use freeform optics.
• Lynx, Advanced X-ray Imaging Satellite (AXIS), and other X-ray telescopes.
• Large telescope mirrors, such as those for the Habitable Exoplanet Observatory (HabEx), OST, and LUVOIR, requiring sub-nanometer metrology.

          

          

     

Potential Non-NASA Applications (Limit 1500 characters, approximately 150 words):

The proposed metrology probe would benefit many applications, including:

• Metrology of high-precision optical components for commercial products
• Metrology of x-ray and neutron mirrors (Department of Energy)
• Vibration analysis of mechanical components and machines

          

          

     

Duration:     6