NASA SBIR 2021-I Solicitation

Proposal Summary


   
Proposal Number:          21-1- S1.07-1908
          
          
   
Subtopic Title:
      In Situ Instruments/Technologies for Lunar and Planetary Science
          
          
   
Proposal Title:
      Fabrication of Analytical Instrumentation Assemblies via Additive Manufacturing
          
          

Small Business Concern

   
Firm:
          
Sears Scientific Consulting, LLC
          
   
Address:
          
10594 Southeast Isaac Drive, Happy Valley, OR 97086
          
   
Phone:
          
(408) 391-4641                                                                                                                                                                                
          

Principal Investigator:

   
Name:
          
Christopher Sears
          
   
E-mail:
          
cmsears@searsscientificconsulting.com
          
   
Address:
          
10594 SE Isaac Dr, OR 97086 - 6289
          
   
Phone:
          
(408) 391-4641                                                                                                                                                                                
          

Business Official:

   
Name:
          
Christopher Sears
          
   
E-mail:
          
cmsears@searsscientificconsulting.com
          
   
Address:
          
10594 SE Isaac Dr, OR 97086 - 6289
          
   
Phone:
          
(408) 391-4641                                                                                                                                                                                
          

Summary Details:

   
Estimated Technology Readiness Level (TRL) :                                                                                                                                                          
Begin: 2
End: 4
          
          
     
Technical Abstract (Limit 2000 characters, approximately 200 words):

We propose to investigate the utilization of additive manufacturing (AM) techniques for the fabrication of analytical instrumentation especially those requiring high or ultra-high vacuum environment to function.  This includes particle optic systems such as electron and ion microscopes, X-ray sources, and mass spectrometers.  By leveraging AM, the weight, cost, and development time can all be significantly reduced, further enabling the exploration capabilities of NASA programs. 

Among AM processes we propose to utilize stereolithographic (SLA) printing due to its ability to provide the highest resolution while producing void-free prints with little built in stress that could later deform the part.  The prints will use engineering resins able to survive high temperatures >200˚C to survive the harsh environment of space.  In addition to the base material, plating-on-plastic will be used to form thick (50-100µm) copper/nickel layer that further strengthens the part while reducing outgassing to that of other metal surfaces and provides the electrostatic surface.  For parts needing to remain electrically isolating, atomic layer deposition of alumna (Al2O3) can be used to mitigate outgassing, or the part can be printed directly into a ceramic-photopolymer resin which is later fired to produce a fully ceramic part. 

For this proposal we will design test articles to verify outgassing performance, measure part accuracy, perform electrical testing on ceramic stand-offs fabricated via AM, and produce an assembled mock-up of a focused ion column to vet the assembly methodology and test high voltage stand-off strength.      

          
          
     
Potential NASA Applications (Limit 1500 characters, approximately 150 words):
  • suitable for lunar, planetary, solar, & satellite instrumentation
  • Compact, light-weight Scanning Electron Microscope (SEM) for planetary or lunar surface analysis
  • In-situ instrumentation fabrication & repair
          
          
     
Potential Non-NASA Applications (Limit 1500 characters, approximately 150 words):
  • Compact, light-weight (<20kg) back-pack Scanning Electron Microscope (SEM)
  • Cost reduction of analytical instrumentation including electron and ion microscopes, flood guns, vacuum gauges and gas analyzers
  • Custom one-off particle optic assemblies for physics research (design & fabrication as-a-service)
  • Low cost vacuum chambers and components for basic research
          
          
     
Duration:     6
          
          

Form Generated on 04/06/2021 12:18:22