NASA SBIR 2020-I Solicitation

Proposal Summary


PROPOSAL NUMBER:
 20-1- Z4.05-6355
SUBTOPIC TITLE:
 Nondestructive Evaluation (NDE) Sensors, Modeling, and Analysis
PROPOSAL TITLE:
 Probability of Detection and Validation for Computed Tomography Processes for Additive Manufacturing (20-RD-231)
SMALL BUSINESS CONCERN (Firm Name, Mail Address, City/State/Zip, Phone)
UES, Inc.
4401 Dayton-Xenia Road
Dayton, OH 45432
(937) 426-6900

Principal Investigator (Name, E-mail, Mail Address, City/State/Zip, Phone)

Name:
Veeraraghavan Sundar
E-mail:
vsundar@ues.com
Address:
4401 Dayton-Xenia Road Dayton, OH 45432 - 1894
Phone:
(937) 429-6900

Business Official (Name, E-mail, Mail Address, City/State/Zip, Phone)

Name:
Ms. Louise Tincher
E-mail:
ltincher@ues.com
Address:
4401 Dayton-Xenia Road Dayton, OH 45432 - 1894
Phone:
(937) 426-6900
Estimated Technology Readiness Level (TRL) :
Begin: 3
End: 5
Technical Abstract (Limit 2000 characters, approximately 200 words)

X-ray computed tomography (CT) is a widely used nondestructive evaluation (NDE) method for quality control and post-build inspection in additively manufactured (AM) components. The limitations of such NDE methods and the need to validate the capability of these methods on an ongoing basis are increasingly recognized. Automated, metallography-based serial sectioning offers a reliable method to establish ground truth data on the flaw populations as well as microstructural variations of AM components. Such data can be used to validate, and subsequently improve the reliability of NDE methods. UES proposes a project aimed at establishing comparison methods and workflows for validating CT (and potentially other NDE data) with ground truth from serial sectioning, and developing probability of detection (POD) curves. The knowledge gained from these efforts will inform CT scan strategies for improved flaw detection in AM components, evaluate flaw detectability in CT using serial sectioning as a ground truth comparison, and quantify the risk of the flaws absent from the CT data sets. Phase II extends the work of validation into the area of in situ detection and validation of in situ sensing methodologies using thermal and visual data.

Potential NASA Applications (Limit 1500 characters, approximately 150 words)
  • NASA experimenting with AM across a broad spectrum of applications and projects.
  • AM has potential applications in the Lunar and Lagrange FabLabs, as well as the Mars Multi-Material FabLab for self sustainment at remote destinations 
  • Improving AM via NDE has positive implications for 100% inspected directives on Orion missions.

 

Potential Non-NASA Applications (Limit 1500 characters, approximately 150 words)
  • Reliable NDE/NDI of completed components remains a barrier to wider utilization of AM components. 
  • Limitations in the availability of probability of detection (POD) data will drive wider adoption of AM.
Duration: 6

Form Generated on 06/29/2020 20:58:05