NASA SBIR 2008 Solicitation


PROPOSAL NUMBER: 08-1 S2.05-9876
SUBTOPIC TITLE: Optics Manufacturing and Metrology for Telescope Optical Surfaces
PROPOSAL TITLE: High-Speed Scanning Interferometer Using CMOS Image Sensor and FPGA Based on Multi-Frequency Phase-Tracking Detection

SMALL BUSINESS CONCERN (Firm Name, Mail Address, City/State/Zip, Phone)
Nanowave Inc
8C Pondview Drive
Sutton, MA 01590 - 2999
(888) 531-1555

PRINCIPAL INVESTIGATOR/PROJECT MANAGER (Name, E-mail, Mail Address, City/State/Zip, Phone)
Tetsuo Ohara
8C Pondview Drive
Sutton, MA 01590 - 2999
(508) 865-6488

Expected Technology Readiness Level (TRL) upon completion of contract: 3

TECHNICAL ABSTRACT (Limit 2000 characters, approximately 200 words)
In this SBIR, we propose a new type of laser interferometer engine for in-situ large optics inspection and metrology and supporting system platform. The proposed FPGA signal processing concept together with new generation high-speed CMOS image sensor enables high speed (> 1m/sec) and real-time continuous surface profiling with minimum local memory. This transforms the currently available laser interferometer into a sub-nanometer precision instrument with only minor modification while providing easy scalability for large optic surface testing and measurement capability simultaneously.

POTENTIAL NASA COMMERCIAL APPLICATIONS (Limit 1500 characters, approximately 150 words)
Due to its scalability and sub-nanometer spatial precision, the proposed technology has the potential to provide the technology foundation for the manufacturing of new astrophysics telescopes and their subsystems which can range from X-ray to millimeter waves, and even gravity waves, regardless of the target optics size. This new method adds an extra dimension in optical interferometers, which traditionally use a single image-frame-based phase mapping, by utilizing the time-domain phase synchronous mapping method. In addition, this can be done without significant modifications in the mechano-optical hardware design of existing optical or other types of interferometers. As a result, the product of this SBIR could be immediately applicable in enhancing many of NASA's projects including Earth science.

POTENTIAL NON-NASA COMMERCIAL APPLICATIONS (Limit 1500 characters, approximately 150 words)
There are countless of applications that need affordable metrology tool, which can be applied on from micro to large size object with high dynamic measurement range and suprior SNR. Such examples are: Metrology and inspection for LCD and Plasma display glass sheet, Semiconductor wafer metrology and process monitoring, Data storage metrology (HDD disk flatness, metrology tool for DVD/CD optics and mold), Fiber optic gyroscope, Film thickness measurement, MEMS (Metrology and process monitoring), Optical coherent tomography, Laser Doppler vibration sensor.

NASA's technology taxonomy has been developed by the SBIR-STTR program to disseminate awareness of proposed and awarded R/R&D in the agency. It is a listing of over 100 technologies, sorted into broad categories, of interest to NASA.

Large Antennas and Telescopes
Portable Data Acquisition or Analysis Tools
Testing Facilities
Ultra-High Density/Low Power

Form Generated on 11-24-08 11:56